Read-out electronics
ASIC controled and read-out by a control board (for tests: can also be
done with standard VME modules+level adapters)
Detailed evaluation of the system
is under way.
Preparation of the read-out of an
array of 3x3 HAPDs in a beam
test.
Backup options use chips from Ideas: a VA/TA based system developed
by the K2K group at KEK and VA64TAP+LS64